Objeto: Services for Scanning Electron Microscopy (SEM). X-ray diffraction (XRD), zeta potential measurements and X-ray photoelectron spectroscopy (XPS).\r\nNecessidad: SEM is a technique that uses an electron microscope to produce images of a sample by scanning the surface with a focused beam of electrons. DRX is a material characterization technique to evaluate the structure of SRGO sponges. XPS was performed to evaluate the successful doping of S atoms differnet generated bonds into the Graph

Institut Català de Recerca de l'Aigua, Fundació Privada (ICRA)DIR3 A09006528

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Objeto: Services for Scanning Electron Microscopy (SEM). X-ray diffraction (XRD), zeta potential measurements and X-ray photoelectron spectroscopy (XPS).\r\nNecessidad: SEM is a technique that uses an electron microscope to produce images of a sample by scanning the surface with a focused beam of electrons. DRX is a material characterization technique to evaluate the structure of SRGO sponges. XPS was performed to evaluate the successful doping of S atoms differnet generated bonds into the Graphene matrix. Z Potential is also